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Принципы флюоресцентной микроскопии cверхвысокого разрешения (обзор)

Принципы флюоресцентной микроскопии cверхвысокого разрешения (обзор)

Н.В. Клементьева, Е.В. Загайнова, К.А. Лукьянов, А.С. Мишин
Ключевые слова: дифракционный предел; субдифракционная флюоресцентная микроскопия; микроскопия структурированного освещения; микроскопия истощения флюоресценции вынужденным излучением; локализационная микроскопия одиночных молекул.​
2016, том 8, номер 2, стр. 130.

Полный текст статьи

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Дифракционный предел разрешения светового микроскопа препятствует наблюдению биологических объектов, размеры которых меньше длины световой волны. Традиционная флюоресцентная микроскопия не позволяет исследовать ультраструктуру, а также процессы, протекающие в живой клетке на уровне макромолекулярных комплексов. Разработка методов высокоразрешающей флюоресцентной микроскопии, преодолевающих дифракционный предел, открыла новые возможности для исследований в сфере биологии и биомедицины. Эти технологии совмещают в себе разрешение, сопоставимое с электронной микроскопией, с неинвазивностью и специфическим мечением, присущими флюоресцентному имиджингу. Рассмотрены современные методы флюоресцентной микроскопии сверхвысокого разрешения, описаны их принципы и области применения. Отмечены ключевые достижения и тенденции развития технологий высокоразрешающей флюоресцентной микроскопии.

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